MIL-PRF-19500-290 Semiconductor Device, Transistor, Pnp, Silicon, Switching, Types, 2N2904, 2N2904A, 2N2904Al, 2N2905, 2N2905A, And 2N2905Al, Jan, Jantx, Jantxv, Jans, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, And JanshThis specification covers the performance requirements for PNP, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Provision for radiation hardness assurance \(RHA\) to four radiation test levels is provided for JANTXV and JANS product assurance levels for type 2N2905A. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/290P

TABLE I. Group A inspection - Continued.

Inspection 1/

MIL-STD-750

Symbol

Limits

Unit

Method

Conditions

Min

Max

Subgroup 4 � Continued.

Small-signal short-circuit

3306

2.0

VCE = 20 V dc, IC = 50 mA dc,

|hfe|

forward-current transfer ratio

f = 100 MHz

Open circuit output

3236

VCB = 10 V dc, IE = 0,

Cobo

capacitance

100 kHz ≤ f ≤ 1 MHz

Input capacitance

3240

Cibo

VEB = 2.0 V dc, IC = 0,

(output open-circuited)

100 kHz ≤ f ≤ 1 MHz (see 4.5.2)

Turn-on time

(See figure 6)

ton

Turn-off time

(See figure 7)

300

toff

Subgroups 5 and 6

Not applicable

1/ For sampling plan, see MIL-PRF-19500.

2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of tests.

A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon

submission.

3/ Separate samples may be used.

4/ Not required for JANS devices.

5/ Not required for laser marked devices.

6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.