MIL-PRF-19500-290 Semiconductor Device, Transistor, Pnp, Silicon, Switching, Types, 2N2904, 2N2904A, 2N2904Al, 2N2905, 2N2905A, And 2N2905Al, Jan, Jantx, Jantxv, Jans, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, And JanshThis specification covers the performance requirements for PNP, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Provision for radiation hardness assurance \(RHA\) to four radiation test levels is provided for JANTXV and JANS product assurance levels for type 2N2905A. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/290P

4.3 Screening (JANTX, JANTXV, and JANS levels only). Screening shall be in accordance with table E-IV of

MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I

herein. Devices that exceed the limits of table I herein shall not be acceptable.

Screen (see table E-IV of

Measurement

MIL-PRF-19500)

JANS level

JANTXV and JANTX level

Required

Required (JANTXV only)

Not applicable

(1) 3c

Required (see 4.3.2)

Not required

Required

Not required

Required

Not applicable

ICBO2, hFE4

24 hours minimum

ICBO2; hFE4

ICBO2; hFE4;

ĆICBO2 = 100 percent of initial value or

5 nA dc, whichever is greater.

ĆhFE4 = �15 percent.

See 4.3.1

Subgroups 2 and 3 of table I herein;

Subgroup 2 of table I herein;

ĆICBO2 = 100 percent of initial value or

5 nA dc, whichever is greater.

ĆhFE4 = �15 percent.

(1) Shall be performed anytime after temperature cycling, screen 3a and does not need to be repeated in

screening requirements. Record thermal impedance for JANS level devices in screen 13 or anytime after

serialization.