MIL-PRF-19500/315G
* TABLE I. Group A inspection.
MIL-STD-750
Symbol
Limits
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2 2/
C/W
ZJX
Thermal impedance
3131
See 4.3.1
*
110
V dc
Breakdown voltage,
3001
Bias condition D;
V(BR)CBO
collector to base
IC = 10 A dc
80
V dc
Breakdown voltage,
3011
Bias condition D;
V(BR)CEO
collector to emitter
IC = 100 mA dc;
pulsed (see 4.5.1)
8
V dc
Breakdown to voltage,
3026
Bias condition D;
V(BR)EBO
emitter to base
IE = 10 A dc
A dc
Collector to base cutoff
3036
Bias condition D;
0.2
ICBO1
current
VCB = 80 V dc
A dc
1.0
Collector to emitter
3041
Bias condition A;
ICEX1
cutoff current
VCE = 110 V dc;
VBE = -0.5 V dc
A dc
Collector to emitter
20
3041
Bias condition D;
ICEO
cutoff current
VCE = 60 V dc
A dc
0.2
Emitter to base cutoff
3061
Bias condition D;
IEBO
current
VEB = 6 V dc
40
120
Forward current transfer
3076
VCE = 5 V dc;
hFE1
ratio
IC = 50 mA dc
40
120
3076
Forward current transfer
VCE = 2 V dc;
hFE2
ratio
IC = 1 A dc pulsed (see 4.5.1)
15
3076
Forward current transfer
VCE = 5 V dc;
hFE3
ratio
IC = 5 A dc pulsed (see 4.5.1)
0.25
V dc
3071
Collector to emitter
IC = 1.0 A dc;
VCE(sat)1
voltage (saturated)
IB = 0.1 A dc; pulsed (see 4.5.1)
1.5
V dc
3071
Collector to emitter
Test condition A; IC = 5.0 A dc;
VCE(sat)2
voltage (saturated)
IB = 0.5 A dc; pulsed (see 4.5.1)
See footnotes at end of table.
11
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