MIL-PRF-19500/315G
* TABLE I. Group A inspection - Continued.
MIL-STD-750
Symbol
Limits
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 2 - Continued 2/
1.2
Base to emitter voltage
V dc
3066
Test condition B; VCE = 2 V dc;
VBE
(non-saturated)
IC = 1 A dc; pulsed (see 4.5.1)
1.2
V dc
3066
Base to emitter voltage
Test condition A; IC = 1 A dc;
VBE(sat)
(saturated)
IB = 0.1 A dc; pulsed (see 4.5.1)
Subgroup 3
High-temperature
TA = 150C
operation:
A dc
50
Collector to emitter
3041
ICEX2
Bias condition A; VCE = 80 V dc;
cutoff current
VBE = 0.5 V dc
A dc
10
Bias condition D;
Collector to base
3036
ICBO2
cutoff current
VCB = 60 V dc
Low-temperature
TA = -55C
operation:
hFE4
VCE = 5 V dc; IC = 1 A dc
Forward-current
15
3076
cutoff current
Subgroup 4
40
Small-signal short- circuit
140
3206
VCE = 5 V dc;
hfe
forward-current transfer ratio
IC = 50 mA dc; f = 1 kHz
3
12
Multitude of small-signal short-
3306
|hfe|
VCE = 10 V dc;
circuit forward current
IC = 1 A dc; f = 10 MHz
transfer ratio
150
pF
Open circuit output
3236
VCB = 10 V dc; IE = 0;
Cobo
capacitance
100 f 1 MHz
Switching parameters:
ns
Pulse delay time
60
See figure 7
td
ns
Pulse rise time
300
See figure 7
tr
s
Pulse storage time
1.7
See figure 7
ts
tf
300
Pulse fall time
See figure 7
ns
See footnotes at end of table.
12
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