MIL-PRF-19500-315 Semiconductor Device, Transistor, Npn, Silicon, Power Types 2N2880, 2N3749, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN, silicon, power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/315G

* TABLE II. Group E inspection (all quality levels) - for qualification and re-qualification only.

Inspection

Sample plan

MIL-STD-750

Method

Conditions

Subgroup 1

45 devices

c=0

Temperature cycling

1051

500 cycles, condition D.

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

See table I, subgroup 2 herein.

Subgroup 2

45 devices

c=0

1,000 hours minimum, TA = 150C, VCB = 80 percent of

Blocking life

1048

rated.

Electrical measurements

See table I, subgroup 2 herein.

Subgroup 4

Thermal impedance curves

See table E-IX of MIL-PRF-19500, group E, subgroup 4.

11 devices

Subgroup 6

1020

ESD

45 devices

Subgroup 8

c=0

Reverse stability

1033

Condition B.