MIL-PRF-19500-347 Semiconductor Device, Transistor, Npn, Silicon, Power Types: 2N3253, 2N3253S, 2N3444, 2N3444S, Jan, And JantxThis specification covers the detail requirements for NPN silicon power transistors. Two levels of product assurance is provided for the device type as specified in MIL-S-19500.

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MIL-PRF-19500/347B

TABLE III. Group E inspection (all quality levels) - for qualification or re-qualification only.

MIL-STD-750

Qualification

Inspection

Method

Conditions

Subgroup 1

45 devices

c=0

1051

Test condition C, 500 cycles

Temperature cycling

(air to air)

1071

Hermetic seal

Fine leak

Gross leak

See table I, subgroup 2 herein.

Electrical measurements

Subgroup 2

45 devices

c=0

Intermittent life

1037

VCB = 10 V dc, 6,000 cycles, forced air cooling allowed on

cooling cycle only. Adjust device current, or power, to

achieve a minimum ĆTJ of +100�C.

Electrical measurements

Table I, subgroup 2 and table II herein.

Subgroup 4

Thermal impedance curves

See MIL-PRF-19500, table E-IX, group E, subgroup 4.

Subgroup 5

Not applicable

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B.