MIL-PRF-19500/371H
TABLE I. Group A inspection.
MIL-STD-750
Limits
Symbol
Unit
Inspection 1/ 2/
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
°C/W
ZθJX
Thermal impedance 3/
3131
See 4.3.2
µA dc
Collector to emitter
3041
VBE = -1.5 V dc; VCE = 700 V dc
ICEX1
20
cutoff current
Emitter to base cutoff
3061
Bias condition D
IEBO1
current
µA dc
2N3902, 2N3902T1,
VEB = 5.0 V dc
200
2N3902T3
µA dc
2N5157, 2N5157T1,
VEB = 6.0 V dc
200
2N5157T3
Collector to emitter
3041
Bias condition D
ICEO
cutoff current
µA dc
2N3902, 2N3902T1,
VCE = 400 V dc
100
2N3902T3
µA dc
2N5157, 2N5157T1,
VCE = 500 V dc
100
2N5157T3
Base emitter voltage
3066
Test condition A; IC = 1.0 A dc;
VBE(SAT)1
1.5
V dc
(saturated)
IB = 0.1 A dc; pulsed (see 4.5.1)
Base emitter voltage
3066
Test condition A; IC = 3.5 A dc;
VBE(SAT)2
2.0
V dc
(saturated)
IB = 0.7 A dc; pulsed (see 4.5.1)
Collector to emitter
3071
IC = 1.0 A dc; IB = 0.1 A dc;
VCE(sat)1
0.8
V dc
saturated voltage
pulsed (see 4.5.1)
Collector to emitter
3071
IC = 3.5 A dc; IB = 0.7 A dc;
VCE(sat)2
2.5
V dc
saturated voltage
pulsed (see 4.5.1)
Forward-current
3076
VCE = 5.0 V dc; IC = 0.5 A dc;
hFE1
25
transfer ratio
pulsed (see 4.5.1)
See footnotes at end of table.
9
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