MIL-PRF-19500/404C
1.4 Primary electrical characteristics. at TA = 25°C unless otherwise specified.
TA = +100°C
Types
C
IR1
VF
IR2
VR = 100 V dc
VR = rated VRWM
IF = rated IF
VR = rated VRWM
f = 0.1 to 0.15 MHz
(see 1.3)
(see 1.3)
(see 1.3)
µA dc
µA dc
pF
V dc
Min
Max
Min
Max
Min
Max
Min
Max
1N5597
13
19
5
30
1
75
1N5600
6
10
7
30
5
100
1N5603
6
10
15
40
5
100
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include
documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has
been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements
documents cited in sections 3 and 4 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document
to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department
of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-19500 - Semiconductor Devices, General Specification for.
STANDARD
MILITARY
MIL-STD-750 - Test Methods for Semiconductor Devices.
(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Defense Automated
Printing Service, Building 4D (NPM-DODSSP), 700 Robbins Avenue, Philadelphia, PA 19111-5094.)
2.2.2 Other publications. The following document forms a part of this specification to the extent specified herein. Unless otherwise
indicated, the issue in effect on the date of invitation for bids or request for proposal shall apply.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
D1868
-
Method of Corona Measurement.
(Application for copies should be addressed to American Society for Testing and Materials, 1916 Race Street, Philadelphia, PA 19103.)
2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for
related associated specifications or specification sheets), the text of this document takes precedence. Nothing in this document,
however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
2
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