MIL-PRF-19500/413F
* TABLE I. Group A inspection.
Symbol
Inspection 1/
MIL-STD-750
Limits
Unit
Min
Max
Method
Conditions
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
Thermal impedance 2/
3131
See 4.3.2
°C/W
ZθJX
Breakdown voltage,
3011
Bias condition D, pulsed
V(BR)CEO
collector to base
(see 4.5.1), IC = 200 mA dc
2N3771
40
V dc
2N3772
60
V dc
Breakdown voltage
3011
Bias condition B, IC = 200
V(BR)CER
mA dc, RBE = 100Ω,
collector to emitter
pulsed (see 4.5.1)
45
2N3771
V dc
70
2N3772
V dc
Breakdown voltage,
3011
Bias condition A, IC = 200
V(BR)CEX
collector to emitter
mA dc, VBE = -1.5 V dc,
pulsed (see 4.5.1)
2N3771
50
V dc
2N3772
90
V dc
Collector-emitter
3041
Bias condition D
ICEO
cutoff current
2N3771
5
mA dc
VCE = 30 V dc
5
2N3772
mA dc
VCE = 50 V dc
Emitter to base
3061
Bias condition D,
2.0
mA dc
IEBO
cutoff current
VBE = 7.0 V dc
Collector-emitter
3041
Bias condition A,
ICEX1
cutoff current
VBE = 1.5 V dc
μA dc
2N3771
20
*
VCE = 50 V dc
μA dc
2N3772
20
*
VCE = 100 V dc
Base emitter voltage
3066
Test condition B, VCE = 4
VBE
(nonsaturated)
V dc, pulsed (see 4.5.1),
2N3771
2.3
V dc
IC = 15 A dc
2N3772
2.0
V dc
IC = 10 A dc
Collector to emitter
3071
Pulsed (see 4.5.1)
VCE(sat)1
voltage (saturated)
2N3771
1.5
V dc
IC = 15 A dc, IB = 1.5 A dc
2N3772
1.2
V dc
IC = 10 A dc, IB = 1.0 A dc
See footnotes at end of table.
7
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