For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-423 Semiconductor Device, Transistor, Npn, Silicon, Switching, Types 2N5581 And 2N5582, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, switching transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15


img
. . . .
MIL-PRF-19500/423G
* TABLE II. Group E inspection (all quality levels) - for qualification or re-qualification only.
MIL-STD-750
Qualification
Inspection
Method
Conditions
Subgroup 1
45 devices
c=0
1051
Test condition C, 500 cycles
Temperature cycling
(air to air)
Electrical measurements
See table I, subgroup 2 and 4.5.2 herein.
Hermetic seal
1071
Fine leak
Gross leak
Subgroup 2
45 devices
c=0
Intermittent life
1037
Intermittent operation life: VCB = 10 V dc, 6,000 cycles.
Adjust device current, or power, to achieve a minimum ĆTJ of
+100°C.
Electrical measurements
See table I, subgroup 2 and 4.5.2 herein.
Subgroup 4
Thermal impedance
3131
See table E-IX of MIL-PRF-19500, group E, subgroup 4.
Sample size
curves
N/A
Subgroup 5
Not applicable
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition B.
11



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.