MIL-PRF-19500/423G
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 2 - Continued
Forward current transfer
3076
VCE = 10 V dc; IC = 0.1 mA dc; pulsed
hFE1
ratio
(see 4.5.1)
2N5581
30
2N5582
50
Forward current transfer
3076
VCE = 10 V dc; IC = 1.0 mA dc; pulsed
hFE2
ratio
(see 4.5.1)
2N5581
35
2N5582
75
Forward current transfer
3076
VCE = 10 V dc; IC = 10 mA dc; pulsed
hFE3
ratio
(see 4.5.1)
40
2N5581
2N5582
100
Forward current transfer
3076
VCE = 10 V dc; IC = 150 mA dc; pulsed
hFE4
ratio
(see 4.5.1)
2N5581
40
120
2N5582
100
300
Forward current transfer
3076
VCE = 10 V dc; IC = 500 mA dc; pulsed
hFE5
ratio
(see 4.5.1)
2N5581
20
2N5582
30
Collector to emitter voltage
3071
0.3
V dc
IC = 150 mA dc; IB = 15 mA dc; pulsed
VCE(sat)1
(saturated)
(see 4.5.1)
Collector to emitter voltage
3071
1.0
V dc
IC = 500 mA dc; IB = 50 mA dc; pulsed
VCE(sat)2
(saturated)
(see 4.5.1)
Base to emitter voltage
3066
0.6
1.2
V dc
Test condition A; IC = 150 mA dc;
VBE(sat)1
(saturated)
Base to emitter voltage
3066
2.0
V dc
Test condition A; IC = 500 mA dc;
VBE(sat)2
(saturated)
Subgroup 3
TA = +150°C
High-temperature operation
µA dc
Collector to base cutoff
3036
10
Bias condition D; VCB = 60 V dc
ICBO3
current
TA = -55°C
Low-temperature operation
Forward current transfer
3076
VCE = 10 V dc; IC = 10 mA dc; pulsed
hFE6
ratio
(see 4.5.1)
2N5581
15
2N5582
35
See footnotes at end of table.
9
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