MIL-PRF-19500/423G
4.4.3.2 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes table I tests herein for conformance inspection. Testing of a subgroup using a single device
type enclosed in the intended package type shall be considered as complying with the requirements for that
subgroup.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein; delta measurements shall be in
accordance with the applicable steps of 4.5.2.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
4.5.2 Delta requirements. Delta requirements shall be as specified below:
Step
Inspection
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
ĆICB02
1
Collector-base cutoff
3036
Bias condition D,
100 percent of initial
VCB = 60 V dc
current
value or 8 nA dc,
(1)
whichever is greater.
ĆhFE4
±25 percent change
2
Forward current
3076
VCE = 10 V dc;
transfer ratio
IC = 150 mA dc;
(1)
from initial reading.
pulsed see 4.5.1
(1) Devices which exceed the table I limits for this test shall not be accepted.
7
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