MIL-PRF-19500/423G
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 4
3206
VCE = 10 V dc; IC = 1 mA dc,
hfe
Small-signal short- circuit
f = 1 kHz
forward-current transfer ratio
30
2N5581
50
2N5582
Magnitude of small- signal
3306
2.5
5.0
VCE = 20 V dc; IC = 20 mA dc;
|hfe |
short-circuit forward-current
f = 100 MHz
transfer ratio
Open circuit output
3236
8
pF
VCB = 10 V dc; IE = 0;
Cobo
100 kHz ≤ f ≤ 1 MHz
capacitance
Input capacitance (output
3240
25
pF
VEB = 0.5 V dc; IC = 0;
Cibo
100 kHz ≤ f ≤ 1 MHz
open circuited)
Turn-on time
(See figure 6)
35
ns
ton
Turn-off time
(See figure 7)
300
ns
toff
Pulse response
(See figure 8)
18
ns
ton + toff
Subgroups 5 and 6
Not required
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure in
table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for laser marked devices.
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