MIL-PRF-19500/430C
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and as follows. Electrical
measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table II
herein.
Method
Condition
Subgroup
VGS = -40 V dc; TA = +175°C; VDS = 0.
B3
1027
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and 4.4.3.1 (JAN, JANTX, and JANTXV) herein for group C
testing. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable
steps of table II herein.
Subgroup
Method
Condition
C2
2036
Lead fatigue: Test condition E.
VGS = -40 V dc; TA = +175°C; VDS = 0.
C6
1027
( 4.4.4 Gate current differential. The gate current of each individual section of a dual unit shall be measured at the
specified conditions and the absolute value of the difference of the two currents shall be calculated. If possible, this
difference shall be measured directly to improve accuracy.
* 4.4.5 Gate-source voltage differential. The gate-source voltage of each individual section of a dual unit shall be
measured at the specified conditions and the absolute value of the difference of the two voltages shall be calculated.
If possible, this difference shall be measured directly to improve accuracy.
* 4.4.6 Gate-source voltage differential change with temperature. The gate-source voltage differential shall be
measured at the two specified temperatures in accordance with 4.4.5 herein except that the polarities of the
differentials and identities of the individual sections shall be maintained. The absolute value of the algebraic
differences between the values at the two temperatures shall be calculated. If possible, this difference should be
measured directly to improve accuracy. A mathematical formula for the parameter is:
|(VGS1 - VGS2)T1 - (VGS1 - VGS2)T2|
* 4.4.7 Zero-gate-voltage drain current ratio. The value for the zero-gate-voltage drain current for each individual
section of a dual unit shall be measured using method 3413 of MIL-STD-750. The zero-gate-voltage drain current
ratio shall be calculated by dividing one of the values by the other. If possible, this ratio shall be measured directly to
improve accuracy.
* 4.4.8 Small-signal common-source forward transfer admittance ratio. The magnitude for the small-signal
common-source forward transfer admittance ratio for each individual section of a dual unit shall be measured using
method 3455 of MIL-STD-750. The small-signal common-source forward transfer admittance ratio shall be
calculated by dividing one of the values by the other. If possible, this ratio shall be measured directly to improve
accuracy.
* 4.4.9 Small-signal common-source output admittance differential. The magnitude for the small-signal common-
source output admittance differential for each individual section of a dual unit shall be measured using method 3453
of MIL-STD-750. The small-signal common-source output admittance differential shall be calculated by dividing one
of the values by the other. If possible, this ratio shall be measured directly to improve accuracy.
4.4.10 Spot noise figure and equivalent input noise voltage. These tests should be conducted with a model
2173C Quan Tech Laboratories test set or equivalent. Conditions shall be as specified in table I.
6
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business