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MIL-PRF-19500-431 Semiconductor Device, Field Effect Transistors, N-Channel, Silicon, Types 2N4091, 2N4092, 2N4093, 2N4091Ub, 2N4092Ub, And 2N4093Ub Jan, Jantx, And JantxvThis specification covers the performance requirements for N-channel, junction, silicon field-effect transistors intended for use in chopper and analog gate circuit applications. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/431E
* TABLE II. Group E inspection (all quality levels) for qualification or re-qualification only.
Inspection
Sample
MIL-STD-750
size
Method
Conditions
Subgroup 1 1/
45 devices
c=0
-55°C to +150°C, 500 cycles
Temperature cycling
1051
Hermetic seal
1071
As applicable
Fine leak
Gross leak
Electrical measurements
See table I, subgroup 2
Subgroup 2 1/
45 devices
c=0
Blocking life
1048
1,000 hours minimum, TA = +150°C, VDG or
VGS = 80 percent of rated.
Electrical measurements
See table I, subgroup 2
Subgroup 4
Not applicable
1/ A separate sample for each test shall be pulled.
10



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