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MIL-PRF-19500-431 Semiconductor Device, Field Effect Transistors, N-Channel, Silicon, Types 2N4091, 2N4092, 2N4093, 2N4091Ub, 2N4092Ub, And 2N4093Ub Jan, Jantx, And JantxvThis specification covers the performance requirements for N-channel, junction, silicon field-effect transistors intended for use in chopper and analog gate circuit applications. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/431E
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and as follows. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
B2
1051
Test condition G.
Condition A, TA = +175°C; VDS = 0; VGS = -24 V dc, 340 hours.
B3
1027
TSTG = +200°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Test condition E, not applicable to UB suffix devices.
VGS = -24 V dc; VDS = 0; TJ = +175°C ±3°C.
C6
1026
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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