For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-501 Semiconductor Device, Darlington Transistor, Pnp, Silicon, Power, Types 2N6051, And 2N6052, Jan, Jantx, And JantxvThis specification covers the performance requirements for PNP, Darlington, silicon, power transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15


img
. . . . . . . . . . . . . .
MIL-PRF-19500/501E
TABLE II. Groups B, C, and E delta measurements. 1/ 2/ 3/
Step
Inspection
Symbol
Limit
Unit
Method
Conditions
Min
Max
ĆhFE2
±40
1
Forward - current
3076
VCE = 3 V dc, IC = 6 A dc,
pulsed (see 4.5.1)
transfer ratio
percent
The delta measurements for table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 are subgroups
1/
3 and 6, see table II herein, step 1.
The delta measurements for table E-VII of MIL-PRF-19500 are subgroup 6, see table II herein, step 1.
2/
3/
The delta measurements for table E-IX of MIL-PRF-19500 are subgroup 1 and 2, see table II herein, step 1.
TABLE III. Group E inspection (all quality levels) - for qualification and re-qualification only.
Inspection
Sample
plan
Method
Conditions
Subgroup 1
45 devices
c=0
1051
500 cycles.
Temperature cycling
1071
Hermetic seal
Fine leak
Gross leak
See table I, subgroup 2 and table II herein.
Electrical measurements
Subgroup 2
45 devices
Test temperature = +125°C; VCB = 80 percent rated;
1048
c=0
Blocking life
T = 1,000 hours.
Electrical measurements
See table I, subgroup 2 and table II herein.
Subgroup 4
Sample size
N/A
Thermal impedance curves
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition B.
11



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.