MIL-PRF-19500/512K
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 2 Continued
Collector - emitter
3071
0.15
V dc
IC = 150 mA dc; IB = 15 mA dc;
VCE(SAT)1
saturated voltage
pulsed (see 4.5.1)
Collector - emitter
3071
0.50
V dc
IC = 500 mA dc; IB = 50 mA dc;
VCE(SAT)2
saturated voltage
pulsed (see 4.5.1)
Collector - emitter
3071
1.0
V dc
IC = 1.0 A dc; IB = 100 mA dc;
VCE(SAT)3
saturated voltage
pulsed (see 4.5.1)
Base emitter
3066
0.9
V dc
Test condition A; IC = 150 mA dc;
VBE(SAT)1
saturated voltage
Base - emitter
3066
1.2
V dc
Test condition A; IC = 500 mA dc;
VBE(SAT)2
saturated voltage
Subgroup 3
TA = +150°C
High-temperature
operation:
µA dc
Collector -base
3036
Bias condition D;
25
ICBO3
cutoff current
VCB = 60 V dc
TA = -55°C
Low-temperature
operation:
Forward-current
3076
30
VCE = 5.0 V dc; IC = 500 mA dc;
hFE5
transfer ratio
pulsed (see 4.5.1)
Subgroup 4
Magnitude of common
3306
1.5
6.0
VCE = 10 V dc; IC = 50 mA dc;
| hfe |
emitter small-signal
f = 100 MHz
short-circuit forward-
current transfer ratio
Open circuit output
3236
20
pF
VCB = 10 V dc; IE = 0;
Cobo
capacitance
100 kHz ≤ f ≤ 1 MHz
Input capacitance
3240
80
pF
VEB = 0.5 V dc; IC = 0;
Cibo
(output open-circuited)
100 kHz ≤ f ≤ 1 MHz
See footnotes at end of table.
15
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