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MIL-PRF-19500-514 Semiconductor Device, Transistor, Npn, Silicon, Power, Types 2N6274 And 2N6277, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN silicon, power transistors. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/514D
* TABLE III. Group E inspection (all quality levels) for qualification and re-qualification only.
Inspection
Sample
plan
Method
Conditions
Subgroup 1
45 devices
c=0
Temperature cycling
1051
500 cycles minimum
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
See table I, subgroup 2 and table II herein.
Subgroup 2
45 devices
c=0
Test temperature = +125°C; VCB = 80 percent of
Blocking life
1048
rated; T = 1,000 hours.
Electrical measurements
See table I, subgroup 2 and table II herein.
Subgroup 4
Sample size
N/A
Thermal impedance
curves
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition B.
11



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