MIL-PRF-19500/514D
TABLE I. Group A inspection.
Inspection 1/
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 1
2071
Visual and mechanical
examination
Subgroup 2
°C/W
ZθJX
3131
See 4.3.2
Thermal impedance 2/
Collector to emitter
3011
Bias condition D; IC = 50 mA dc;
V(BR)CEO
breakdown voltage
pulsed (see 4.5.1)
2N6274
100
V dc
2N6277
150
V dc
µA dc
Collector to emitter cutoff
3041
Bias condition D
ICEO
50
current
2N6274
VCE = 50 V dc
2N6277
VCE = 75 V dc
µA dc
Collector to emitter cutoff
3041
Bias condition A; VBE = -1.5 V dc
ICEX1
10
current
2N6274
VCE = 120 V dc
2N6277
VCE = 180 V dc
µA dc
Emitter-base cutoff current
3061
Bias condition D; VEB = 6 V dc
IEBO
100
µA dc
Collector to base cutoff
3036
Bias condition D,
ICBO
10
current
2N6274
VCB = 120 V dc
2N6277
VCB = 180 V dc
Base emitter saturated
3066
Test condition A; IC = 20 A dc; pulsed
VBE(sat)
1.8
V dc
voltage
(see 4.5.1) IB = 2.0 A dc
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 1 A dc;
hFE1
50
pulsed (see 4.5.1)
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 20 A dc;
hFE2
30
120
pulsed (see 4.5.1)
Forward-current transfer ratio
3076
VCE = 4 V dc; IC = 50 A dc;
hFE3
10
pulsed (see 4.5.1)
Collector to emitter saturated
3071
IC = 20 A dc; pulsed (see 4.5.1)
VCE(sat)1
1.0
V dc
voltage
IB = 2.0 A dc
Collector to emitter saturated
3071
IC = 50 A dc; IB = 10 A dc;
VCE(sat)2
3.0
V dc
voltage
pulsed (see 4.5.1)
See footnotes at end of table.
7
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