MIL-PRF-19500/527E
* 4.3 Screening (list applicable JAN levels). Screening shall be in accordance with table E-IV of MIL-PRF-19500
and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that
exceed the limits of table I herein shall not be acceptable.
Screen (table E-IV) of
Measurement
MIL-PRF-19500.
JANTX and JANTXV levels
(1) 3c
Thermal impedance (see 4.3.2)
7
Optional
11
ICEX1 and hFE1
12
See 4.3.1
13
Subgroup 2 of table I herein;
ĆICEX1 = 100 percent of initial value or
2 µA dc, whichever is greater.
ĆhFE1 = ± 25 percent of initial value.
14
Required
(1) May be performed anytime before screen 9.
4.3.1 Burn-in conditions. TJ = 162.5 ± 12.5°C, 2N6648 = VCB = -30 V dc, 2N6649 = VCB = -40 V dc,
2N6650 = VCB = -60 V dc.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW (VC and VH where
appropriate). Measurement delay time (tMD) = 70 µs max. See table II, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of
MIL-PRF-19500, and table I herein. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb of MIL-PRF-19500 and herein Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
6
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