MIL-PRF-19500/527E
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
n = 45 devices, c = 0
examination
Subgroup 2
°C/W
3131
See 4.3.2
Thermal impedance 2/
ZθJX
Bias condition D; IC = 200 mA dc
Collector emitter
3011
V dc
V(BR)CEO
breakdown voltage
pulsed (see 4.5.1).
2N6648
-40
2N6649
-60
2N6650
-80
Collector - emitter
3011
V dc
V(BR)CER
Bias condition B; IC = 200 mA dc
breakdown voltage
RBB = 100 ohms, pulsed (see
4.5.1).
2N6648
-40
2N6649
-60
2N6650
-80
Collector - emitter
3041
Bias condition D
-1
mA dc
ICEO
cutoff current
2N6648
VCE = -40 V dc
2N6649
VCE = -60 V dc
2N6650
VCE = -80 V dc
Emitter - base
3061
-10
mA dc
Bias condition D; VEB = 5 V dc
IEBO
cutoff current
Collector - emitter
3041
Bias condition D;
ICEX1
µA dc
cutoff current
10
VBE = 1.5 V dc
2N6648
VCE = -40 V dc
2N6649
VCE = -60 V dc
2N6650
VCE = -80 V dc
Bias condition D
3036
Collector - base
-1
mA dc
ICBO
cutoff current
2N6648
VCE = -40 V dc
2N6649
VCE = -60 V dc
2N6650
VCE = -80 V dc
See footnotesat end of table.
8
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