MIL-PRF-19500/528B
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup Method
Condition
*
C2
2036
Test condition A, weight = 10 pounds, t = 15 s.
*
C5
3131
See 4.3.2.
For solder die attach: VCB 10 V dc, 6,000 cycles, TA +35C.
C6
1037
For eutectic die attach: VCB 10 V dc, TA +35C, adjust PT to achieve
TJ = +175C min.
* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Input capacitance. This test shall be conducted in accordance with method 3240 of MIL-STD-750, except
the output capacitor shall be omitted.
4.5.3 Coil selection for safe operating area tests. In selecting coils for use in clamped and unclamped inductive
SOAR tests, prime consideration should be given to the recommended commercially available coil. However, due to
the extreme critical nature of the coil in these circuits and wide tolerance of some commercially available coils (+100,
-50 percent), it shall be the semiconductor manufacturer's responsibility, to prove upon request, compliance or
equivalency of any coil used (commercial or inplant designed) to be within (+20, -10 percent) of the specified
inductance at the rated current and dc resistance.
6
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business