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MIL-PRF-19500-545 Semiconductor Device, Transistor, Pnp, Silicon, Power, Types 2N5151, 2N5153, 2N5151L, 2N5153L, 2N5151U3, And 2N5153U3, Jan, Jantx, Jantxv, Jantxvf, Jantxvr, Jans, Janhc, And Jankc, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcb, Janhcc, Janhcd, Jankcb, Jankcc, Jankcd, Jankccm, Jankccd, Jankccp, Jankccl, Jankccr, Jankccf, Jankccg, And JankcchThis specification covers the performance requirements for PNP, silicon, power transistors for use in high-speed power-switching applications. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/545K

* TABLE I. Group A inspection - Continued.

Inspection 1/

Symbol

Limits

Unit

MIL-STD-750

Method

Conditions

Min

Max

Subgroup 5

Safe operating area (dc)

3051

Pre-pulse condition for each test:

TC = +25�C, (see figure 15)

Pulse condition for each test:

tp = 1 sec. 1 cycle TC = +25�C

VCE = -5.0 V dc, IC = -2 A dc

Test # 1

for TO-205

VCE = -5.8 V dc, IC = -2 A dc for U3

VCE = -32 V dc, IC = -310 mA dc

Test # 2

for TO-205

VCE = -32 V dc, IC = -360 mA dc

for U3

VCE = -80 V dc, IC = -12.5 mA dc

Test # 3

for TO-205

VCE = -80 V dc, IC = -14.5 mA dc

for U3

TC = +25�C; RBB1 = 10 Ω;

Safe operating area

RBB2 = 100 Ω; L = 0.3 mH;

(unclamped inductive)

RL = 0.1 Ω; VCC = -10 V dc;

VBB1 = -10 V dc; VBB2 = 4 V dc;

IC = -10 A dc (see figure 13)

End point electrical

See table I, subgroup 2

measurements

Subgroups 6 and 7

Not applicable

1/ For sampling plan see MIL-PRF-19500.

2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests.

A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be

rerun upon submission.

3/ Separate samples may be used.

4/ Not required for JANS devices.

5/ Not required for laser marked devices.

6/ Hermetic seal test is an end-point to temperature cycling in addition to electrical measurements.

7/ This test required for the following end-point measurements only:

Group B, steps 2 and 3 (JAN, JANTX, and JANTXV).

Group B, subgroups 3 and 4 (JANS).

Group C, subgroup 2 and 6.

Group E, subgroup 1.