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MIL-PRF-19500-617 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode Or Anode Center Tap, Ultrafast, Types 1N6672 Through 1N6674 And 1N6672R Through 1N6674R, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for a silicon, dual high voltage, ultra-fast power rectifier diodes. Four levels of product assurance are provided for each device type as specified in MIL PRF-19500.

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MIL-PRF-19500/617D
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions of appendix E,
tables E-VIa (JANS) and E-VIb (JANTX and JANTXV) of MIL-PRF-19500. Electrical measurements (end-points)
shall be in accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.
* 4.4.2.1 Group B inspection, appendix E, table E-VIa (JANS of MIL-PRF-19500).
Method
Condition
Subgroup
B4
1037
TA = room ambient as defined in the general requirements of MIL-STD-750 (see
4.5).IF or IO = 1.25 to 10 A. Minimum for 2,000 cycles.
B5
1027
For irradiated devices, include trr as an end-point measurement.
* 4.4.2.2 Group B inspection, appendix E, table E-VIb (JANTX and JANTXV of MIL-PRF-19500).
Method
Condition
Subgroup
B3
1037
TA = room ambient as defined in the general requirements of MIL-STD-750 (see
4.5). IF or IO = 1.25 to 10 A. minimum for 2,000 cycles. For irradiated devices,
include trr as an end-point measurement.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.
* 4.4.3.1 Group C inspection, appendix E,table E-VII of MIL-PRF-19500.
Method
Condition
Subgroup
C2
2036
Test condition A, weight = 10 pounds, t = 15 seconds.
RJC = 2.0C/W.
C5
4081
TA = room ambient as defined in the general requirements of MIL-STD-750 (see
C6
1037
4.5). IF or IO = 1.25 to 10 A for 6,000 cycles. For irradiated devices, include trr as
an end-point measurement.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. Delta requirements shall be in accordance with table III
herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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