MIL-PRF-19500/625A
4.2.2.2 Group B inspection, appendix E, table VIb (JAN, JANTX and JANTXV or MIL-PRF-19500).
Subgroup
Method
Conditions
3
1037
TA = room ambient as defined in the general requirements of
MIL-STD-750,
(see 4.5); V(pk) = rated VRWM; f = 50-60 Hz (see 4.5.1); IO = 200 mA.
Note: Leaded samples from the same lot may be used in lieu of US
suffix sample for life test.
5
3101
See 4.5.3.
or
4081
TA = +175°C.
6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in
appendix E, table VII of MIL-PRF-19500. Electrical measurements (end-points) requirements shall be in accordance with the applicable
steps and footnotes of table I, group A, subgroup 2 herein.
4.4.3.1 Group C Inspection, appendix E, table VII of MIL-PRF-19500
Subgroup
Method
Conditions
2
2036
Tension: Test condition A; weight 4 pounds, t = 15 seconds
Lead fatigue: Test condition E.
Note: Not applicable for US suffix types.
6
1026
Note: Leaded samples from the same lot may be used in lieu of
U suffix samples for life tests.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Life test. These tests shall be conducted with a half-sine waveform of the specific peak voltage impressed across the diode in
the reverse direction followed by a half-sine waveform of the specified average rectified current. The forward conduction angle of the
rectified current shall be neither greater than 180 degrees, nor less than 150 degrees.
4.5.2 Scope display. The reverse breakdown characteristics shall be viewed on an oscilloscope with display calibration factors of 20
µA per division. Reverse current over the knee shall be at least 100 µA and less than 200 µA. Any discontinuity or dynamic instability of
the trace shall be cause of rejection of that device.
4.5.3 Thermal resistance. Thermal resistance measurement shall be performed in accordance with MIL-STD-750, method 3101 or
4081. Forced moving air or draft shall not be permitted across the devices during test. The maximum limit for RθJL under these test
conditions shall be RθJL (max) = 160°C/W and RθJEC (max) = 100°C/W. The following conditions shall be applied if method 3101 is
used.
75 mA to 300 mA.
IH .......................................................................................................
25 seconds minimum.
tH .......................................................................................................
1 mA to 10 mA.
IM .......................................................................................................
100 µs maximum.
tMD.....................................................................................................
LS = Lead spacing = 9.53 mm (.375 inch).
LS = 0 for US versions.
8
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