MIL-PRF-19500-625 Semiconductor, Device, Diode, Silicon, Switching Types 1N6683, 1N6684, 1N6685, In6683Us, 1N6684Us, And 1N6685Us Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for switching diodes, suitable for high stress environments where silver button construction may be inadequate \(see 6.3\).

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MIL-PRF-19500/625A

4.5.4 Pulse measurements. Conditions for pulse measurements shall be as specified in section 4 of

MIL-STD-750.

) measurements. The ZθJX measurements shall be performed in accordance with

4.5.5 Thermal impedance (Z

θJX

MIL-STD-750, method 3101. The maximum limit for ZθJX in screening (table II of MIL-PRF-19500) shall not exceed the group A,

subgroup 2 limit. The conditions for ZθJX testing are as follows:

5-10 amps.

IH .......................................................................................................

10 ms.

tH .......................................................................................................

1 mA to 10 mA.

IM .......................................................................................................

100 �s max.

tMD.....................................................................................................

4.5.5.1 For initial qualification or requalification. Read and record data (ZθJX) shall be supplied to the qualifying activity on one lot

(random sample of 500 devices minimum). Twenty-two serialized devices shall be sent to the qualifying activity for test correlation.