For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-169 Semiconductor Device, Diode, Silicon, Switching, Types 1N3070, 1N3070-1, 1N3070Ur-1, 1N4938, 1N4938-1, 1N4938Ur-1, Jan, Jantx, Jantxv, Janhc, And JankcThis specification covers the performance requirements for silicon, switching diodes. Three levels of product assurance are provided for each device type and two product assurance levels are provided for die, as specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16


img
MIL-PRF-19500/169N
TABLE I. Group A inspection.
MIL-STD-750
Limit
Symbol
Unit
Inspection 1/
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
°C/W
ZΘJX
Thermal impedance 2/
3101
See 4.3.3
Forward voltage
4011
IF = 100 mA dc
VF1
1.0
V dc
IR = 100 µA dc
Breakdown voltage
4021
VBR
200
V dc
Reverse current
4016
DC method, VR = 175 V dc
IR1
100
nA dc
Subgroup 3
TA = +150°C
High temperature operation:
µA dc
Reverse current
4016
DC method, VR = 175 V dc
IR2
100
TA = -55°C
Low temperature operation:
Forward voltage
4011
IF = 100 mA dc
VF2
1.2
V dc
Subgroup 4
Junction capacitance
4001
VR = 0 V dc, f = 1 MHz,
C1
5.0
pF
Vsig = 50 mVp-p maximum
Reverse recovery time
4031
trr
50
ns
Condition B, IF = 30 mA dc,
IR = 30 mA dc, IR(REC) = 3.0 mA dc
Method 4023 of MIL-STD-750,
Scope display evaluation
4023
figures 4023-3, -7, -9, -10 only
Subgroup 5
Not applicable
Subgroup 6
Surge current
4066
IF = 0 mA dc; ten surges at 1 for each
minute; tp = 1 µs; IFSM = 2.0 A (pk)
Electrical measurements
Table I, subgroup 2
1/ For sampling plan, see MIL-PRF-19500.
2/ Not applicable to JANC.
11



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.