MIL-PRF-19500/169N
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500. Manufacturer's identification and date code
shall be marked on the devices. Initial container package marking shall be in accordance with MIL-PRF-19500. The
polarity shall be indicated with a contrasting color band to denote the cathode end. The prefixes JAN, JANTX, and
JANTXV can be abbreviated as J, JX, and JV, respectively. The part number may be reduced to J4938, JX4938, or
JV4938. No color coding shall be permitted for part numbering.
3.5.1 UR devices. For `UR' version devices only, all marking, except polarity may be omitted from the body, but
shall be retained on the initial container. Polarity marking of `UR' devices shall consist as a minimum, a band or three
contrasting dots around the periphery of the cathode.
3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I.
3.7 Electrical test requirements. The electrical test requirements shall be as specified in table I herein.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not require the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
4.3 Screening (JANTXV, JANTX, and JAN levels). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. Specified electrical measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screening
(see table E-IV of
JANTXV and JANTX level
MIL-PRF-19500)
(1) 3c
Thermal impedance (see 4.3.3)
9
Not required
Method 1038 of MIL-STD-750, condition A
10
IR1 and VF1
(2) 11
12
See 4.3.2
Subgroup 2 of table I herein; ĆIR1 = 100 percent of initial value or 50 nA dc,
(3) (4) 13
whichever is greater; ĆVF1 ≤ 25mVdc.
(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in
accordance with MIL-PRF-19500, screen 3 prior to this thermal test.
(2) Test within 24 hours after removal from test.
(3) When thermal impedance is performed prior to screen 13, it is not required to be repeated in screen 13.
(4) PDA ≤ 5 percent.
8
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