MIL-PRF-19500/169N
4.3.1 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with
appendix G of MIL-PRF-19500. Burn-in duration for the JANHC follows JANTX requirements; the JANKC level
follows JANS requirements.
4.3.1.1 JAN testing. JAN level product will have temperature cycling and thermal impedance testing performed in
accordance with MIL-PRF-19500 JANTX level screening level requirements.
4.3.2 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.1): Method 1038 of
MIL-STD-750, condition B. VR = rated VRWM; f = 50 - 60 Hz; IO(min) or IF(min) = IO(PCB). The maximum current
density of small die shall be submitted to the qualifying activity for approval. With approval of the qualifying activity
and preparing activity, alternate burn-in criteria (hours, bias conditions, mounting conditions) may be used for JANTX
and JANTXV quality levels. A justification demonstrating equivalence is required. In addition, the manufacturing
site's burn-in data and performance history will be essential criteria for burn-in modification approval.
4.3.3 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3101 or 4081 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW (VC and VH where
appropriate). Measurement delay time (tMD) = 70 µs max. See table II, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500,
table I herein, and as specified herein. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2.
* 4.4.2.1 Group B inspection, table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Leaded samples from
the same lot may be used in lieu of `UR' suffix sample for life test.
Subgroup Method
Conditions
0°C to +100°C, 10 cycles.
B2
1056
-55°C to +175°C, 45 cycles, including screening.
B2
1051
IF = 100 mA, axial tensile stress = 10 lbs, TA = +150°C; (not applicable to UR package).
B2
2005
V(pk) = rated VRWM; f = 50 - 60 Hz; IO = 100 mA dc minimum; adjust TA or IO to obtain a
B3
1026
minimum TJ of +150°C (see 4.5.1).
B4
2101
Decap analysis; scribe and break only.
TA = +175°C.
B6
1032
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
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