MIL-PRF-19500/312E
* TABLE I. Group A inspection - Continued.
Inspection 1/
Symbol
Unit
MIL-STD-750
Limits
Method
Conditions
Min
Max
Subgroup 4 - Continued
25
ns
Charge storage time
ts
IC = IB1 = -IB21 = 10 mA dc
(see figure 3)
40
ns
Turn-on time
ton
IC = 10 mA dc; IB1 = 3 mA dc;
VBE(0) =-2.0 V dc
(see figure 4)
75
ns
Turn-off time
IC = 10 mA dc; IB1 = 3 mA dc;
toff
IB2 = -1 mA dc; (see figure 4)
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of tests.
A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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