MIL-PRF-19500-312 Semiconductor Device, Transistor, Npn, Silicon, Switching Type 2N708, Jan, Jantx, And JanhcThis specification covers the detail requirements for NPN silicon switching transistors. Two levels of product assurance are provided for the device type as specified in MIL-PRF-19500. One level of product assurance is provided for die.

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MIL-PRF-19500/312E

* TABLE III. Group E inspection (all quality levels) - for qualification or re-qualification only.

Qualification

MIL-STD-750

Inspection

Method

Conditions

Subgroup 1

45 devices

c=0

Temperature cycling

1051

Test condition C, 500 cycles

(air to air)

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

See table I, subgroup 2 and table II herein.

Subgroup 2

45 devices

c=0

Intermittent life

1037

Intermittent operation life: VCB = 10 V dc, 6,000 cycles. Adjust

device current, or power, to achieve a minimum ĆTJ of +100�C.

Electrical measurements

See table I, subgroup 2 and table II herein.

Subgroup 4

See MIL-PRF-19500.

Sample size

Thermal impedance

N/A

curves

Subgroup 5

Not applicable

Subgroup 6

3 devices

Electrocstatic discharge

1020

(ESD)

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B for devices < 400 V.