MIL-PRF-19500/317R
* TABLE I. Group A inspection.
Inspection 1/ 2/
MIL-STD-750
Limit
Unit
Method
Conditions
Symbol
Min
Max
Subgroup 1 3/
Visual and mechanical 4/
2071
examination
Solderability 4/ 5/
2026
n = 15 leads, c = 0
1022
n = 15 devices, c = 0
Resistance to solvents 4/ 5/ 6/
Temp cycling 4/ 5/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 5/
1071
n = 22 devices, c = 0
Fine leak
Test conditions G or H
Gross leak
Test conditions C or D
Table I, subgroup 2
Electrical measurements 5/
Precondition TA = +250°C
Bond strength 4/ 5/
2037
at t = 24 hrs or TA = 300°C at
t = 2 hrs; n = 11 wires, c = 0
Decap internal visual 5/
2075
n = 4 devices, c = 0
Subgroup 2
ĆVBE
Thermal impedance 7/
3131
See 4.3.3
mV
µA dc
Collector to base cutoff current
3036
Bias condition D; VCB = 40 V dc
ICBO1
10
*
µA dc
Emitter to base cutoff current
3061
IEBO1
10
2N2369A, 2N4449
Bias condition D; VEB = 4.5 V dc
*
2N3227
Bias condition D; VEB = 6.0 V dc
*
Breakdown voltage, collector to
3011
Bias condition D; IC = 10 mA dc;
V(BR)CEO
emitter
pulsed (see 4.5.1)
15
V dc
2N2369A, 2N4449
20
V dc
2N3227
µA dc
Collector to emitter cutoff current
3041
Bias condition C; VCE = 20 V dc
ICES
0.4
µA dc
Collector to base cutoff current
3036
Bias condition D; VCB = 32 V dc
ICBO2
0.2
µA dc
Emitter to base cutoff current
3061
Bias condition D; VEB = 4 V dc
IEBO2
0.25
Forward-current transfer ratio
3076
VCE = 0.35 V dc; IC = 10 mA dc
hFE1
pulsed (see 4.5.1).
2N2369A, 2N4449,
40
120
2N3227
70
250
Forward-current transfer ratio
3076
VCE = 0.4 V dc; IC = 30 mA dc
hFE2
pulsed (see 4.5.1).
2N2369A, 2N4449
30
120
2N3227
40
250
See footnotes at end of table.
16
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