MIL-PRF-19500-317 Semiconductor Device, Transistor, Npn, Silicon, Switching, Types 2N2369A, 2N3227, 2N4449, 2N2369Au, 2N3227U, 2N2369Aua, 2N3227Ua, 2N2369Aub, 2N2369Aubc, 2N2369Aubcn 2N3227Ub, 2N3227Ubc, 2N3227Ubcn, 2N4449U, 2N4449Ua, 2N4449Ub, 2N4449Ubc, And 2N4449Ubcn, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhca, Janhcb, Jankca, Jankcb, Jank...This specification covers the performance requirements for NPN, silicon, high speed switching transistors \(including dual devices\). Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to four radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators ┬ôM┬ö, ┬ôD┬ö, ┬ôP┬ô, ┬ôL┬ö, ┬ôR┬ö, ┬ôF┬Æ, ┬ôG┬ö, and ┬ôH┬ö are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/317R

4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCE = 5 - 15 V dc, PD = 360 mW

(500 mW for U), TA = room ambient as defined in 4.5 of MIL-STD-750. With approval of the qualifying activity and

preparing activity, alternate burn-in criteria (hours, bias conditions, TJ, mounting conditions) may be used for JANTX

and JANTXV quality levels. A justification demonstrating equivalence is required. In addition, the manufacturing

site's burn-in data and performance history will be essential criteria for burn-in modification approval.

4.3.2. Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with

appendix G of MIL-PRF-19500. Burn-in duration for the JANKC level follows JANS requirements; the JANHC follows

JANTX requirements.

4.3.3 Thermal impedance (ĆVBE measurements). The ĆVBE measurements shall be performed in accordance with

method 3131 of MIL-STD-750 using the guidelines in that method for determining VH, VCE, IM, IH, tH, tSW, and tMD. The

ĆVBE limit used in screen 3c of 4.3 herein and table I, subgroup 2 shall be set statistically by the supplier over several

die lots and submitted to the qualifying activity for approval. See table IV, group E, subgroup 4 and figures 9, 10, 11,

12, and 13 herein.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as

specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened

devices shall be submitted to and pass the requirements of group A1 and A2 inspection only (table E-VIb, group B,

subgroup 1 is not required to be performed again if group B has already been satisfied in accordance with 4.4.2).

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I

herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table E-VIa (JANS) of MIL-PRF-19500 and 4.4.2.1. Electrical measurements (end-

points) shall be in accordance with table I, subgroup 2. Delta requirements shall be in accordance with table II herein.

See 4.4.2.2 for JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points) for JAN, JANTX, and

JANTXV shall be after each step in 4.4.2.2 and shall be in accordance with table I, subgroup 2 herein. Delta

measurements shall be in accordance with table III herein.

4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.

Subgroup

Method Condition

1037

VCB = 12 V dc, tON = tOFF = 3 minutes, PD(ON) = PD max rated, see 1.3; PD(OFF) = 0.

VCB = 12 V dc. PD ≥ 100 percent of maximum rated PT (see 1.3). Option 1: 96 hrs min,

1027

Sample size in accordance with table E-VIa of MIL-PRF-19500, adjust TA to achieve

TJ = +275�C minimum. Option 2: 216 hrs min., sample size = 45, c = 0; adjust TA to achieve

TJ = +225�C minimum. (NOTE: If a failure occurs, resubmission shall be at the test

conditions of the original sample.)