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MIL-PRF-19500-343 Semiconductor Device, Transistor, Npn, Silicon, Low Power, Types 2N2857 And 2N2857Ub, Jan, Jantx, Jantxv, And Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Janhcf, Janhcg, Jansh, Janhc, And JankcThis specification covers the performance requirements for NPN, silicon, low power, ultra-high frequency transistors. Four levels of product assurance are provided for each device type. Two levels of product assurance are provided for unencapsulated devices as specified in MIL-PRF-19500. RHA level designators "M", "D", "P", "L", "R",

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MIL-PRF-19500/343K
* TABLE I. Group A inspection - Continued.
MIL-STD-750
Limits
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 4 - Continued.
Collector-base time
4
15
ps
VCB = 6 V dc; IE = 2 mA dc;
rb' Cc
constant
f = 31.9 MHz (see figure 8)
Subgroups 5, 6, and 7
Not applicable
1/ For sampling plan (unless otherwise specified), see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A failure
in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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