MIL-PRF-19500/343K
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-VIa (JANS) of MIL-PRF-19500 and 4.4.2.1 herein. See 4.4.2.2 herein for
JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein. Delta measurements shall be in accordance with table III herein.
*
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
*
B4
1037
VCB = 5 - 15 V dc, 2,000 cycles, tON = tOFF = 3 minutes, PD(ON) = PD max rated in
VCB = 10 V dc; 340 hours maximum rated power shall be applied and ambient
B5
1027
temperature adjusted to achieve TJ = +150°C minimum. n = 45, c = 0.
* 4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX, and JANTXV). Separate samples may be used for each
step. In the event of a group B failure, the manufacturer may pull a new sample at double size from either the failed
assembly lot or from another assembly lot from the same wafer lot. If the new "assembly lot" option is exercised, the
failed assembly lot shall be scrapped.
Step
Method
Conditions
*
1
1026
1,000 hours at VCB = 10 V dc; power shall be applied and ambient temperature
adjusted to achieve TJ = +150°C minimum and a minimum of PD = 100 percent of
maximum rated PT as defined in 1.3 n = 45, c = 0. The sample size may be increased
and the test time decreased as long as the devices are stressed for a total of 45,000
device hours minimum, and the actual time of test is at least 340 hours.
Blocking life: TA = +150°C, VCB = 80 percent of rated voltage, 48 hours minimum.
2
1048
n = 45 devices, c = 0.
High temperature life (non-operating), t = 340 hours; TA = +200°C. n = 22, c = 0.
3
1032
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a. For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot.
See MIL-PRF-19500.
b. Shall be chosen from an inspection lot that has been submitted to and passed group A conformance
inspection. When the final lead finish is solder or any plating prone to oxidation at high temperature, the
samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and JANTXV) may be
pulled prior to the application of final lead finish.
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-VII of MIL-PRF-19500, and in 4.4.3.1 herein (JANS). See 4.4.3.2 herein for
JAN, JANTX, and JANTXV group C testing. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein. Delta measurements shall be in accordance with table III herein.
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