MIL-PRF-19500/343K
* 4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen (see table E-IV
Measurement
of MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
(1) 3c
Thermal impedance, method 3131
Thermal impedance, method 3131 of
of MIL-STD-750 (see 4.3.3).
MIL-STD-750 (see 4.3.3).
9
ICES, hFE1.
Not applicable.
10
48 hours minimum.
48 hours minimum.
ICES, hFE1;
ICES, hFE1.
ĆICES = 100 percent of initial value or
11
5 nA, whichever is greater;
ĆhFE1 = 15 percent.
See 4.3.1.
See 4.3.1.
12
13
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ĆICES = 100 percent of initial value or
ĆICES = 100 percent of initial value or
5 nA dc, whichever is greater;
5 nA dc, whichever is greater;
ĆhFE1 = 15 percent .
ĆhFE1 = 15 percent.
*
(1) Shall be performed anytime after temperature cycling, screen 3a; TX and TXV do not need to be repeated in
screening requirements.
* 4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: VCB = 15 V dc; PT = 200 mW at,
TA = room ambient as defined in the general requirements of 4.5 of MIL-STD-750. NOTE: No heat sink or forced air
cooling on the devices shall be permitted.
4.3.2 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with
MIL-PRF-19500, "Discrete Semiconductor Die/Chip Lot Acceptance". Burn-in duration for the JANKC level follows
JANS requirements; the JANHC follows JANTX requirements.
* 4.3.3 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tMD (and VC where
appropriate). The thermal impedance limit shall comply with the thermal impedance graph on figures 4, 5, and 6 (less
than or equal to the curve value at the same tH time) and shall be less than the process determined statistical
maximum limit as outlined in method 3131 of MIL-STD-750. See table IV, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. If alternate screening is being performed in accordance with E.5.3.1d of MIL-PRF-19500, a sample
of screened devices shall be submitted to and pass the requirements of group A1 and A2 inspection only (table
E-VIb, group B, subgroup 1 is not required to be performed again if group B has already been satisfied in accordance
with 4.4.2).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
7
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business