MIL-PRF-19500/343K
*
4.4.3.1 Group C inspection, JANS, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition E; not applicable for UB devices.
RθJA and RθJC only, as applicable (see 1.3).
C5
3131
*
C6
1026
1,000 hours at VCB = 10 V dc; power shall be applied and ambient temperature adjusted to
achieve TJ = +150°C minimum and a minimum of PD = 100 percent of maximum rated PT
as defined in 1.3 n = 45, c = 0. The sample size may be increased and the test time
decreased as long as the devices are stressed for a total of 45,000 device hours minimum,
and the actual time of test is at least 340 hours.
4.4.3.2 Group C inspection, JAN, JANTX, and JANTXV, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
C2
2036
Test condition E; not applicable for UB devices.
C5
3131
C6
Not applicable.
4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes group A tests for conformance inspection. When the final lead finish is solder or any plating
prone to oxidation at high temperature, the samples for C6 life test may be pulled prior to the application of final lead
finish. Testing of a subgroup using a single device type enclosed in the intended package type shall be considered
as complying with the requirements for that subgroup.
4.4.4 Group D inspection. Conformance inspection for hardness assured JANS, JANJ, and JANTXV types shall
include the group D tests specified in table II herein. These tests shall be performed as required in accordance with
MIL-PRF-19500 and method 1019 of MIL-STD-750, for total ionizing dose or method 1017 of MIL-STD-750 for
neutron fluence as applicable (see 6.2 herein), except group D, subgroup 2 may be performed separate from other
subgroups.
* 4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table IV herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of
MIL-STD-750.
* 4.5.2 Noise figure. The noise figure shall be measured using commercially available test equipment and its
associated standard test procedures (see figures 7 and 8).
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