MIL-PRF-19500/354L
TABLE I. Group A inspection - Continued.
MIL-STD-750
Limit
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 4 - Continued.
Small-signal open-
3216
VCE = 5 V dc;
hoe
circuit output admittance
IC = 1 mA dc; f = 1 kHz
µmhos
2N2604, UB
40
µmhos
2N2605, UB
60
Small-signal short-
3206
VCE = 5 V dc;
hfe
circuit forward-current
IC = 1 mA dc; f = 1 kHz
transfer ratio
2N2604, UB
60
180
2N2605, UB
150
450
Magnitude of common
3306
1
8
VCE = 5 V dc;
|hfe|
emitter small-signal short-
IC = 0.5 mA dc;
circuit forward- current
f = 30 MHz
transfer ratio
Cobo
Open circuit
3236
6
PF
VCB = 5 V dc; IE = 0;
output capacitance
100 kHz ≤ f ≤ 1 MHz
VCE = 5 V dc; IC = 10 µA dc;
Noise figure
3246
5
dB
F1
Rg = 10 kΩ; f = 100 Hz
VCE = 5 V dc; IC = 10 µA dc;
Noise figure
3246
3
dB
F2
Rg = 10 kΩ; f = 1 kHz
VCE = 5 V dc; IC = 10 µA dc;
Noise figure
3246
3
dB
F3
Rg = 10 kΩ; f = 10 kHz
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be
rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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