MIL-PRF-19500/376K
4.3.1 Screening (JANHC and JANKC). Screening for JANHC and JANKC die shall be in accordance with
MIL-PRF-19500 "Discrete Semiconductor Die/Chip Lot Acceptance". Burn-in duration for the JANKC level follows
JANS requirements; the JANHC follows JANTX requirements.
4.3.2 Power burn-in conditions. Power burn-in conditions are as follows: VCB = 10 to 30 V dc, power shall be
applied to achieve TJ = +135C minimum using a minimum PD = 75 percent of PT maximum rated as defined in 1.3.
With approval of the qualifying activity and preparing activity, alternate burn-in criteria (hours, bias conditions, TJ, and
mounting conditions) may be used for JANTX and JANTXV quality levels. A justification demonstrating equivalence
is required. In addition, the manufacturing site's burn-in data and performance history will be essential criteria for
burn-in modification approval.
4.3.3 Thermal response. For very small junction devices such as this, the term thermal response shall be used in
lieu of thermal impedance although measurements shall be performed the same way as thermal impedance in
accordance with method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tMD (and
VC where appropriate). Measurement delay time (tMD) = 70 s max. See group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened
devices shall be submitted to and pass the requirements of subgroups 1 and 2, of table I herein, inspection only
(table E-VIb, group B, subgroup 1 is not required to be performed again if group B has already been satisfied in
accordance with 4.4.2).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-VIa (JANS) of MIL-PRF-19500 and 4.4.2.1. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. Delta requirements shall be in accordance with table
IV herein. See 4.4.2.2 for JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points) and
delta requirements for JAN, JANTX, and JANTXV shall be after each step in 4.4.2.2 and shall be in accordance with
table I, subgroup 2 herein. Delta requirements shall be after each step and shall be in accordance with table IV
herein.
4.4.2.1 Group B inspection (JANS), table E-VIa of MIL-PRF-19500.
Subgroup Method
Condition
B4
1037
VCB = 10 V dc, 2,000 cycles, adjust device current, or power, to achieve a minimum
TJ of +100C.
VCB = 10 V dc; PD 100 percent of maximum rated PT (see 1.3). (NOTE: If a failure
B5
1027
occurs, resubmission shall be at the test conditions of the original sample.)
Option 1: 96 hours minimum sample size in accordance with MIL-PRF-19500, table E-VIa,
adjust TA or PD to achieve TJ = +275C minimum.
Option 2: 216 hours minimum, sample size = 45, c = 0; adjust TA or PD to achieve a
TJ = +225C minimum.
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