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MIL-PRF-19500-408 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N3715 And 2N3716, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN, silicon, high-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/408K
Procedure:
1.
With switch S1 closed, set the specified test conditions.
Open S1. Device fails if clamp voltage not reached.
2.
3.
Perform specified end-point tests.
L = 4.0 mH, 0.05Ω, 20 A, Q ≥ 100 at 1 kHz, (Sanford Miller CK-20 or equivalent).
4.
FIGURE 7. Clamp inductive sweep test circuit.
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