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MIL-PRF-19500-408 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N3715 And 2N3716, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN, silicon, high-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/408K

TABLE I. Group A inspection � Continued.

Limit

MIL�STD�750

Inspection 1/

Symbol

Unit

Method

Conditions

Min

Max

Subgroup 5

TC = +25�C; t ≥ 1 s; 1 cycle;

Safe operating area

3051

(continuous dc)

(see figure 5)

VCE = 15 V dc; IC = 10 A dc

Test 1

VCE = 40 V dc; IC = 3.75 A dc

Test 2

Test 3

VCE = 55 V dc; IC = 0.9 A dc

2N3715

VCE = 65 V dc; IC = 0.9 A dc

2N3716

TA = +25�C; IC = 10 A dc;

Safe operating area

3053

(switching) (clamped

VCC = 15 V dc;

inductive)

(see figures 6 and 7)

2N3715

Clamp voltage = 60 V dc

2N3716

Clamp voltage = 80 V dc

tp approximately 1.0 ms (vary to

Test 1

obtain IC);

RBB1 = 5Ω; VBB1 = 8 V dc;

RBB2 = 4Ω; VBB2 = 0; VCC = 15 V

dc; IC = 5 A dc; L = 4 mH; Q ≥ 100

at 1 kHz; .05 ohms, 20 A dc;

(Stanford Miller CK-20 or

equivalent)

tp approximately 2.2 ms (vary to

Test 2

obtain IC);

RBB1 = 5Ω; VBB1 = 8 V dc;

RBB2 = 4Ω; VBB2 = 0; VCC = 15 V

dc; IC = 2.2 A dc; L = 20 mH;

Q ≥ 6,000 at 10 kHz; 0.22 ohms,

12.5 A dc; (two Stancor C-2688 in

series or equivalent)

Electrical measurements

See subgroup 2 of this table

Subgroups 6 and 7

Not applicable

For sampling plan, see MIL�PRF�19500.

This test required for the following end-point measurements only:

Group B, subgroups 3, 4, and 5 (JANS).

Group B, subgroups 2 and 3 (JAN, JANTX, and JANTXV).

Group C, subgroup 2 and 6.

Group E, subgroup 1.