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MIL-PRF-19500-408 Semiconductor Device, Transistor, Npn, Silicon, High-Power, Types 2N3715 And 2N3716, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for NPN, silicon, high-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/408K
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse response measurements. The conditions for pulse response measurement shall be as specified in
section 4 of MIL­STD­750.
4.6 Delta requirements. The requirements for delta measurements for groups B, C, and E shall be as specified
below. (1) (2) (3) (4)
Limits
Symbol
Unit
Step
Inspection
Method
Conditions
Min
Max
ĆhFE2
VCE = 2.0 V dc;
1
Forward-current
3076
±25 percent change from
IC = 3.0 A dc;
transfer ratio
initial value
(5)
pulsed (see 4.5.1)
ĆVCE(SAT)1  ±50 percent change from
IC = 5 A dc;
2
Saturation voltage,
3071
IB = 0.5 A dc;
collector to emitter
initial value
pulsed (see 4.5.1)
(5)
(1) The delta measurements for group B, quality level JANS, shall be as follows:
a.  In addition to the measurements specified for subgroup 4 of table E­VIA of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
b.  In addition to the measurements specified for subgroup 5 of table E­VIA of MIL­PRF­19500, the
measurements of steps 1 and 2 shall also be taken.
(2) The delta measurements for group B, quality levels JAN, JANTX and JANTXV shall be as follows:
a.  In addition to the measurements specified for subgroup 3 of table E­VIB of MIL­PRF­19500, the
measurements of steps 1 shall also be taken.
b.  In addition to the measurements specified for subgroup 6 of table E­VIB of MIL­PRF­19500, the
measurements of step 1 shall also be taken.
(3) The delta measurements for group C shall be as follows:
a.  In addition to the measurements specified for subgroup 6 of table E­VII of MIL­PRF­19500, the
measurements of all steps shall also be taken for JANS.
b.  In addition to the measurements specified for subgroup 6 of table E­VII of MIL­PRF­19500, the
measurements of step 1 shall also be taken for JAN, JANTX, and JANTXV.
(4) The delta measurements for group E, all quality levels, shall be as follows: In addition to the measurements
specified for subgroups 1 and 2 of table E­IX of MIL­PRF­19500, the measurements of steps 1 and 2 shall
also be taken.
(5) Devices which exceed the table I (group A) limits for this test shall not be acceptable.
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