MIL-PRF-19500/420M
* 4.3 Screening (JANS, JANTXV, and JANTX levels only). Screening shall be in accordance with appendix E, table
E-IV of MIL-PRF-19500, and as specified herein. Specified electrical measurements shall be made in accordance
Screen (see
Appendix E,
JANS level
JANTXV and JANTX level
table E-IV of
(1) 3c
VF1 and IR1
9
Not applicable
Method 1038 of
Method 1038 of
10
MIL-STD-750, condition A
MIL-STD-750, condition A
VF1 and IR1; ĆVF1 ≤ ±0.1 V dc
VF1 and IR1
(2) 11
*
ĆIR1 ±250 nA dc or 100 percent of initial
value whichever is greater.
12
Required, see 4.3.2
Required, see 4.3.2
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
(2) (3) 13
*
ĆIR1 ≤ 100 percent of initial reading or 250
ĆIR1 ≤ 100 percent of initial reading or 250 nA dc,
nA dc, whichever is greater.
whichever is greater.
ĆVF1 ≤ ±.1 V dc change from initial value.
ĆVF1 ≤ ±.1 V dc change from initial value.
Scope display evaluation (see 4.5.3)
Scope display evaluation (see 4.5.3)
(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in
accordance with MIL-PRF-19500, screen 3 prior to this thermal test.
* (2) For JANTX and JANTXV devices, ΔVF1 may be omitted if thermal impedance is performed, unless
irradiation is used to reduce the carrier lifetime.
(3) ZθJX is not required in screen 13, if already previously performed.
4.3.1 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3101 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, and K factor where appropriate).
Measurement delay time (tMD) = 70 µs max. The limit will be statistically derived. See appendix E, table E-IX
4.3.2 Free air power burn-in conditions. Power burn-in conditions are as follows (see 4.5.2 and 4.5.2.1): IO = 3A
minimum; TA = 55°C maximum. Test conditions in accordance with method 1038 of MIL-STD-750, condition B. Use
method 3100 of MIL-STD-750 to measure TJ. Adjust IO or TA to achieve the required TJ. TJ = 135°C minimum. With
approval of the qualifying activity and preparing activity, alternate burn-in criteria (hours, bias conditions, TJ, mounting
conditions) may be used for JANTX and JANTXV quality levels. A justification demonstrating equivalence is required.
In addition, the manufacturing site's burn-in data and performance history will be essential criteria for burn-in
modification approval.
4.3.3 Screening (JANHC and JANKC). Screening of die shall be in accordance with appendix G of
MIL-PRF-19500. As a minimum, die shall be 100-percent probed to ensure compliance with table I, subgroup 2.
Burn-in duration for the JANKC level follows JANS requirements; the JANHC follows JANTX requirements.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein. ZθJX endpoint shall be derived by the supplier and approved by the qualifying activity. This ZθJX end-point
shall be documented in the qualification report.
12
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business