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MIL-PRF-19500-437 Semiconductor Device, Diode, Silicon, Low-Noise Voltage Regulator, Types 1N5518B-1, 1N5518C-1, 1N5518D-1 Through 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518Bur-1, 1N5518Cur-1, 1N5518Dur-1 Through 1N5546Bur-1, 1N5546Cur 1, 1N5546Dur-1, Jan, Jantx, Jantxv, Janhc, And JankcThis specification covers the performance requirements for 500 milliwatt, silicon, low-noise, voltage regulator diodes with voltage tolerances of 5 percent, 2 percent, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type die. For JANHC and JANKC quality levels \(see 6.5\).

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MIL-PRF-19500/437H
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3101 or 4081 as applicable in MIL-STD-750 using the guidelines in that method for determining IM, IH, tH,
tMD (and VC where appropriate). Measurement delay time (tMD) = 70 μs max.
4.3.3 Power burn-in conditions. Power burn-in conditions are as follows (see 4.5.4): TA = 55°C maximum. Test
conditions in accordance with method 1038 of MIL-STD-750, condition B. Adjust IZ or TA to achieve the required TJ.
TJ = 125°C minimum. With approval of the qualifying activity and preparing activity, alternate burn-in criteria (hours,
bias conditions, TJ, mounting conditions) may be used for JANTX and JANTXV quality levels. A justification
demonstrating equivalence is required. In addition, the manufacturing site's burn-in data and performance history
shall be essential criteria for burn-in modification approval. Mounting condition see figure 10 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table E-V of
MIL-PRF-19500 , and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VIb (JANTXV and JANTX) of MIL-PRF-19500 , and as follows. Electrical
measurements (end-points) and delta requirements shall be in accordance with table III herein.
4.4.2.1 Group B inspection, appendix E, table E-VIb of MIL-PRF-19500.
Method
Conditions
Subgroup
0°C to +100°C, 10 cycles.
B2
1056
-55°C to +175°C, 25 cycles.
B2
1051
B3
1027
IZM = 50 percent of column 10 of table IV (minimum). Adjust IZ or TA to ensure
a TJ= +150ēC (min).
B4
2101
Decap analysis scribe and break only.
B5
Not applicable
B6
1032
TA = +175ēC.
8



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