MIL-PRF-19500/437H
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points)
and delta requirements shall be in accordance with table III herein.
4.4.3.1 Group C inspection, appendix E, table E-VII of MIL-PRF-19500.
Subgroup
Method
Conditions
0°C to +100°C, 10 cycles.
C2
1056
-55°C to +175°C, 20 cycles.
C2
1051
C2
2036
Test condition A; 4 pounds; t = 15 seconds.
2036
Test condition E.
C2
1071
Test condition E.
C3
Not applicable.
C5
4081
See 4.3.2.
C6
1026
IZM = 50 percent of column 10 of table IV (minimum). Adjust IZ or TA to ensure a
TJ = +150șC (min).
IZ = column 11 of table IV, T1 = +25°C ±5°C, T2 = +125°C ±5°C, ∝VZ = column 8
C8
4071
of table IV, sampling plan = 22 devices, c = 0.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and table II herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Surge current (IZSM ). The peak currents shown in column 4 of table IV shall be applied in the reverse
direction and these shall be superimposed on the current (Iz = column 11 of table IV) a total of five surges at 1
minute intervals. Each individual surge shall be one-half square-wave-pulse of 8.3 ms duration or an equivalent
one-half sinewave with the same effective rms current.
4.5.2 Regulator voltage measurements. The test current shall be applied until thermal equilibrium is attained (20
±2 seconds) prior to reading the breakdown voltage. For this test, the diode shall be suspended by its leads with
mounting clips whose inside edge is located at .375 inch (9.53 mm) from the body and the mounting clips shall be
maintained at a temperature of +25°C +8°C, -2°C. This measurement may be performed after a shorter time
following application of the test current than that which provides thermal equilibrium if correlation to stabilized
readings can be established to the satisfaction of the Government.
4.5.3 Temperature coefficient of regulator voltage (∝Vz). The device shall be temperature stabilized with current
applied prior to reading regulator voltage at the specified ambient temperature as specified in 4.4.3.1, subgroup C8.
4.5.4 Free air burn-in and life tests. The use of a current limiting or ballast resistor is permitted provided that each
DUT still sees the IZ(min) described in 4.3.3 and that the minimum applied voltage, where applicable, is maintained
through-out the burn-in period. Use method 3100 of MIL-STD-750 to measure TJ.
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