MIL-PRF-19500/441K
TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
2071
n = 45 devices, c = 0
Visual and mechanical 3/
examination
2026
n = 15 leads, c = 0
Solderability 3/ 4/
1022
n = 15 devices, c = 0
Resistance to 3/ 4/ 5/
solvent
1051
Test condition C, 25 cycles,
Temp cycling 3/ 4/
n = 22 devices, c = o
1071
n = 22 devices, c = 0
Hermetic seal 4/
Fine leak
Gross leak
Table I, subgroup 2 herein
Electrical measurements 4/
Pre-condition TA = +250°C at t = 24 hrs
2037
Bond strength 3/ 4/
or TA = +300°C at t = 2 hrs,
n = 11 wires, c = 0
Subgroup 2
°C/W
Thermal impedance 6/
3131
See 4.3.3
ZθJX
Breakdown voltage,
3011
Bias condition D; IC = 100 mA dc;
V (BR)CEO
collector to emitter
pulsed (see 4.5.1)
2N3740, 2N3740U4
60
V dc
2N3741, 2N3741U4
80
V dc
µA dc
Collector to emitter
3041
Bias condition D
10
ICEO
cutoff current
2N3740, 2N3740U4
VCE = 40 V dc
2N3741, 2N3741U4
VCE = 60 V dc
Emitter to base
3061
Bias condition D; VEB = 7 V dc
100
nA dc
IEBO
cutoff current
Collector to emitter
3041
Bias condition A; VBE = 1.5 V dc
300
nA dc
ICEX1
cutoff current
2N3740, 2N3740U4
VCE = 60 V dc
2N3741, 2N3741U4
VCE = 80 V dc
Collector to base
3036
Bias condition D
100
nA dc
ICBO
cutoff current
2N3740, 2N3740U4
VCE = 60 V dc
2N3741, 2N3741U4
VCE = 80 V dc
See footnotes at end of table.
11
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