MIL-PRF-19500/441K
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of
MIL-PRF-19500, and table I herein. End-point electrical measurements shall be in accordance with table I, subgroup
2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical measurements (end-points)
requirements for JANS shall be in accordance with table I, subgroup 2 herein. Delta requirements shall be in
accordance with table II herein. See 4.4.2.2 herein for JAN, JANTX, and JANTXV group B testing. Electrical
measurements (end-points) and delta requirements for JAN, JANTX, and JANTXV shall be after each step in 4.4.2.2
and shall be in accordance with table I, subgroup 2 and table II herein.
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Method
Conditions
Subgroup
B4
1037
VCB = 10 V dc, 2,000 cycles, tON = tOFF = 3 minutes, PD(ON) = PD max rated in
accordance with 1.3; PD(OFF) = 0.
B5
1027
(NOTE: If a failure occurs, resubmission shall be at the test conditions of the
original sample.) VCB = 10 V dc, PD ≥ 100 percent of maximum rated PT (see 1.3).
Option 1: 96 hours minimum sample size in accordance with table VIa of
MIL-PRF-19500, adjust TA or PD to achieve TJ = +275°C minimum.
Option 2: 216 hours minimum, sample size = 45, c = 0; adjust TA or PD to
achieve TJ = +225°C minimum.
4.4.2.2 Group B inspection, (JAN, JANTX and JANTXV) herein. Separate samples may be used for each step. In
the event of a group B failure, the manufacturer may pull a new sample at double size from either the failed assembly
lot or from another assembly lot from the same wafer lot. If the new "assembly lot" option is exercised, the failed
assembly lot shall be scrapped.
Method
Condition
Step
1
1037
6,000 cycles, tON = tOFF = 3 minutes, PD(ON) = PD max rated per 1.3; PD(OFF) = 0. n = 45,
c = 0.
Blocking life: TA = +150°C, VCB = 80 percent of rated voltage, 48 hours min. n = 45, c = 0.
2
1048
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22, c = 0.
3
1032
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX, and JANTXV, samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot.
See MIL-PRF-19500.
b.
Shall be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
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