MIL-PRF-19500/441K
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 5 - Continued.
Test 2
tp = 1.5 ms (vary to obtain IC);
IC = .25 A dc; L = 80 mH
(min) at .25 A with a maximum dc
resistance of 1 Ω. For reference only.
ESSEX Stancor C-2691 or Triad C = 48
TA = +25°C; VCC = 55 V dc
SOA (clamped switching)
(destructive)
(see figures 10 and 11); duty cycle
≤ 5 percent, tp = 1.5 ms (vary to
obtain IC); IC = 4 A dc
2N3740, 2N3740U4
Clamp voltage = 60 V dc
2N3741, 2N3741U4
Clamp voltage = 80 V dc
End-point electrical
See table I, subgroup 2 herein
measurements
Subgroups 6 and 7
Not applicable
1/
For sampling plan, see MIL-PRF-19500.
2/
For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests.
3/
Separate samples may be used.
4/
Not required for JANS.
5/
Not required for laser marked devices.
6/
This test required for the following end-point measurements only:
Group B, subgroups 3, 4, and 5 (JANS).
Group B, see 4.4.2.2 herein, after each step (JAN, JANTX, and JANTXV).
Group C, subgroup 2 and 6 for JANS and subgroup 2 only for JAN, JANTX, and JANTXV.
Group E, subgroup 1.
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