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MIL-PRF-19500-485 Semiconductor Device, Transistor, Pnp, Silicon, Low-Power Types: 2N5415, 2N5415S, 2N5415Ua, 2N5415U4, 2N5416, 2N5416S, 2N5416Ua, And 2N5416U4, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhcb, Janhcd, Jankcb, Jankcd, Jankcbm, Jankcbd, Jankcbp, Jankcbl, Jankcbr, Jankcbf, Jankcbg, And JankcbhThis specification covers the performance requirements for PNP, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/485N

TABLE I. Group A inspection - Continued.

Inspection 1/

MIL-STD-750

Symbol

Limits

Unit

Method

Conditions

Min

Max

Subgroup 5

Pulse response

3251

Test condition A

�s

Turn-on time

ton

VCC = 200 V dc, IC = 50 mA dc,

IB1 = 5 mA dc, (see figure 9).

�s

Turn-off time

VCC = 200 V dc, IC = 50 mA dc,

toff

IB1 = IB2 = 5 mA dc,

(see figure 9).

Subgroup 6

Not applicable

Subgroup 7

Breakdown voltage, collector to

3011

IC = 50 mA dc, IB = 5 mA dc,

V(BR)CEO

emitter

L = 25 mH; f = 30 - 60 Hz,

(see figure 10).

2N5415, S, UA, U4

200

V dc

2N5416, S, UA, U4

300

V dc

TC = +25�C, 1 cycle, t = 0.4 s, (see

Safe operating area

3051

(continuous dc)

figures 11, 12, and 13). n = 22, c = 0

Test 1 (except UA)

VCE = 10 V dc, IC = 1 A dc.

Test 2 (except UA)

VCE = 100 V dc, IC = 100 mA dc.

Test 3 (except UA)

VCE = 200 V dc.

(2N5415, S, U4 only)

IC = 24 mA dc.

Test 4

VCE = 300 V dc.

(2N5416, S, U4 only)

IC = 10 mA dc.

Test 1 UA only

VCE = 10 V dc, IC = 0.3 A dc.

Test 2 UA only

VCE = 100 V dc, IC = 30 mA dc.

Test 3 UA only

VCE = 200 V dc.

(2N5415UA only)

IC = 12 mA dc.

Test 4

VCE = 300 V dc.

(2N5416UA only)

IC = 5 mA dc.

Electrical measurements

See table I, subgroup 2 herein.

1/ For sampling plan see MIL-PRF-19500.

2/ For resubmission of failed subgroup 1, double the sample size of the failed test or sequence of tests. A failure

in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon

submission.

3/ Separate samples may be used.

4/ Not required for JANS devices.

5/ Not required for laser marked devices.

6/ This test required for the following end-point measurements only:

Group B, step 1 of 4.4.2.2 herein (JAN, JANTX, and JANTXV).

Group B, subgroups 3, 4, and 5 (JANS).

Group C, subgroup 2 and 6.

Group E, subgroup 1 and 2.